Witt and Vook Model - WVM

Last change: 29 Ocotber 2011

Thomas Wieder

http://www.tu-darmstadt.de/~wieder

wieder@tu-darmstadt.de    thomas.wieder@t-online.de


Introduction:

The computer program WVM calculates lattice constants of thin films from X-ray reflection positions according to Witt and Vook's model.


News:


Program Description:

wvm.tex


Source Code:

wvm.f

Computer Physics Communications Program Library: http://cpc.cs.qub.ac.uk/summaries/ADDM_v1_0.html


Input Files, Examples:

wvm.in


Literature:

T. Wieder:
WVM: A computer program for the determination of lattice parameters and strains in thin films;
Computer Physics Communications 96 (1996), 53 - 60.
doi:10.1016/0010-4655(96)00055-0

T. Wieder:
Calculation of thermally induced strains in thin films of any crystal class;
Journal of Applied Physics 78 (1995), 838 - 841.
link.aip.org/link/?JAPIAU/78/838/1
doi:10.1063/1.360273

F. Witt and R.W. Vook,
Thermally Induced strains in Cubic Metal Films,
Journal of Applied Physics 39 (1968), 2773 - 2776.


Licensing Provisions:

The computer program WVM is exclusively totally free.


Legal Matters:

I make no warranties, expressed or implied, that the program WVM is free of error, or is consistent with any particular standard of merchantability, or that it will meet your requirements for any particular application. It (WVM) should not be relied on for solving a problem whose incorrect solution could result in injury to a person or loss of property. If you do use the program in such a manner, it is at your risk. The author disclaims all liability for direct or consequential damages resulting from your use of the program.


File History:

Version: 23 June1997, 31 July 2000, 30 January 2011

First published in the WWW: June 1997


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