Witt and Vook Model - WVM
Last change: 29 Ocotber 2011
Thomas Wieder
http://www.tu-darmstadt.de/~wieder
wieder@tu-darmstadt.de thomas.wieder@t-online.de
Introduction:
The computer program WVM calculates lattice constants of thin films
from
X-ray reflection positions according to Witt and Vook's model.
News:
Program Description:
wvm.tex
Source Code:
wvm.f
Computer Physics Communications Program Library: http://cpc.cs.qub.ac.uk/summaries/ADDM_v1_0.html
Input Files, Examples:
wvm.in
Literature:
T. Wieder:
WVM: A
computer program for the determination of lattice parameters and
strains in thin films;
Computer Physics
Communications
96 (1996), 53 - 60.
doi:10.1016/0010-4655(96)00055-0
T. Wieder:
Calculation
of thermally induced strains in thin films of any crystal class;
Journal of Applied Physics 78 (1995),
838 - 841.
link.aip.org/link/?JAPIAU/78/838/1
doi:10.1063/1.360273
F. Witt and R.W. Vook,
Thermally Induced strains in Cubic Metal Films,
Journal of Applied Physics 39 (1968), 2773 - 2776.
Licensing Provisions:
The computer program WVM is exclusively totally free.
Legal Matters:
I make no warranties, expressed or implied, that the program WVM is
free
of error, or is consistent with any particular standard of
merchantability,
or that it will meet your requirements for any particular
application.
It (WVM) should not be relied on for solving a problem whose
incorrect
solution could result in injury to a person or loss of property. If
you
do use the program in such a manner, it is at your risk. The author
disclaims
all liability for direct or consequential damages resulting from
your
use
of the program.
File History:
Version: 23 June1997, 31 July 2000, 30 January 2011
First published in the WWW: June 1997
END OF FILE